مشخصات مقاله | |
ترجمه عنوان مقاله | خصوصیات نوری فیلم های نازک تلورید کادمیوم تبخیر شده به روش حرارتی |
عنوان انگلیسی مقاله | Optical properties of thermally evaporated cadmium telluride thin films |
انتشار | مقاله سال 2003 |
تعداد صفحات مقاله انگلیسی | 7 صفحه |
هزینه | دانلود مقاله انگلیسی رایگان میباشد. |
پایگاه داده | نشریه الزویر |
نوع نگارش مقاله |
مقاله پژوهشی (Research article) |
مقاله بیس | این مقاله بیس نمیباشد |
نمایه (index) | scopus – master journals – JCR |
نوع مقاله | ISI |
فرمت مقاله انگلیسی | |
ایمپکت فاکتور(IF) |
2.057 در سال 2017 |
شاخص H_index | 124 در سال 2019 |
شاخص SJR | 0.615 در سال 2017 |
شناسه ISSN | 0254-0584 |
شاخص Quartile (چارک) | Q2 در سال 2017 |
رشته های مرتبط | فیزیک |
گرایش های مرتبط | فیزیک کاربردی – اپتیک و لیزر |
نوع ارائه مقاله |
ژورنال |
مجله / کنفرانس | Materials Chemistry and Physics |
دانشگاه | Thin Film Laboratory, Department of Physics, Pratap College, Amalner 425401, Jalgaon District, Maharashtra, India |
کلمات کلیدی | تبخیر حرارتی، خصوصیات نوری، گاف باند، XRD |
کلمات کلیدی انگلیسی | Thermal evaporation, Optical properties, Band gap, XRD |
شناسه دیجیتال – doi |
https://doi.org/10.1016/S0254-0584(02)00336-X |
کد محصول | E11866 |
وضعیت ترجمه مقاله | ترجمه آماده این مقاله موجود نمیباشد. میتوانید از طریق دکمه پایین سفارش دهید. |
دانلود رایگان مقاله | دانلود رایگان مقاله انگلیسی |
سفارش ترجمه این مقاله | سفارش ترجمه این مقاله |
فهرست مطالب مقاله: |
Outline Abstract 1. Introduction 2. Experimental 3. Results and discussion 4. Conclusions Acknowledgements References |
بخشی از متن مقاله: |
Abstract Polycrystalline CdTe films have been deposited onto glass substrates at 373 K by vacuum evaporation technique. The transmittance and reflectance have been measured at normal and near normal incidence, respectively, in the spectral range 200–2500 nm. The dependence of absorption coefficient, α on the photon energy have been determined. Analysis of the result showed that for CdTe films of different thicknesses, direct transition occurs with band gap energies in the range 1.45–1.52 eV. Refractive indices and extinction coefficients have been evaluated in the above spectral range. The XRD analysis confirmed that CdTe films are polycrystalline having hexagonal structure. The lattice parameters of thin films are almost matching with the JCPDS 82-0474 data for cadmium telluride. © 2002 Elsevier Science B.V. All rights reserved. Introduction Cadmium telluride is considered at present one of the most promising materials, for device applications. It has high absorption coefficient in the visible range of the solar spectrum and its band gap is close to the optimum value for efficient solar energy conversion [1,2]. The material can be prepared in n-type and p-type forms so that solar cells can be formed in both homojunction and heterojunction configurations. A survey of the literature shows that different techniques of deposition have been developed to obtain device grade CdTe thin films, among which electrodeposition [3], rf sputtering [4], closed vapor transport [5], spray pyrolysis [6], screen printing [7], and vacuum evaporation [8,9] are worth mentioning. All these techniques have their own merits and demerits in producing high quality CdTe films. Recently several workers have studied structural characteristic and optical properties depending on the deposition conditions [10–17]. Most of these investigations did not deal with each deposition condition, separately and some contradictions appeared in the results. Therefore in this work systematic investigation of the effect of the preparation conditions on the optical properties and structural characteristic has been carried out. An interpretation of the determined optical constant variations in correlation with the corresponding structural parameters is presented. |